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Semiconductor Materials Testing

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    Semiconductor Materials Testing

    Semiconductor material testing is a technique for analyzing and testing the characteristic parameters of semiconductor materials. Due to the wide variety of semiconductor materials, complex processing techniques, different shapes, and high technical difficulties, it is necessary to measure the characteristic parameters of semiconductor materials to truly reflect the quality of semiconductor materials, master the generation process of their key parameters, so as to guide the update and iteration of R&D technology.

    When manufacturing semiconductor devices such as transistors, there are certain requirements for the conductive type, resistivity value, minority carrier lifetime, dislocation density and other parameters of semiconductor materials, and different devices have different requirements. Whether the prepared materials meet the requirements of manufacturing devices must also be tested and identified. The measurement of material resistivity, non-equilibrium minority carrier lifetime and dislocation density are the most important and basic work in material identification.

    It can be seen that semiconductor materials are the cornerstones of industries such as microelectronics, optoelectronics, and solar energy, and their electrical, optical, and mechanical properties will affect the performance and quality of semiconductor devices. Therefore, the testing and analysis of the performance and structure of semiconductor materials is an important aspect of the research and development of semiconductor materials.

    Our testing scope of includes, but is not limited to:

    • Elemental semiconductor
    • Inorganic compound semiconductor
    • Organic compound semiconductor
    • Amorphous and liquid semiconductors

    Our testing items include, but are not limited to:

    Semiconductor Materials Testing

    • Resistivity testing
    • Extension resistance testing
    • Minority carrier lifetime testing
    • Minority carrier diffusion length testing
    • Hall effect testing
    • Infrared spectrum testing
    • Energy level transient spectrum testing
    • Positron annihilation spectroscopy testing
    • Photofluorescence spectrum testing
    • Ultraviolet-visible absorption spectrum testing
    • Electron beam induced current testing
    • I-V and C-V testing

    Performance evaluation and methods of semiconductor materials

    • Structural integrity of crystals: Crystal orientation, lattice defects (dislocation density)
    • Composition analysis: Chemical composition of materials, density and distribution of doped atoms, oxygen and carbon content, heavy metal impurities, etc.
      • Doping concentration analysis: Hall measurement, C-V measurement, secondary ion mass spectrometer.
      • Oxygen and carbon content: Infrared absorption spectroscopy.
      • Analysis of trace impurities such as heavy metals: Auger electron spectroscopy (AES), X-ray emission spectroscopy (XES), X-ray emission spectroscopy (XPS), neutron activation analysis (NAA), mass spectrometry, atomic absorption spectroscopy.
    • Electrical conductivity: Conductivity type, resistivity, minority carrier lifetime, etc.
      • Conductivity: Four probe method, three probe method, non-contact method, extended resistance method.
    • Optical properties: Refractive index, absorption coefficient, photoconductivity, luminescence characteristics of thin film materials, etc.
    • Key performance testing: Band gap, resistivity, carrier mobility (electrons and holes in semiconductors), non-equilibrium carrier lifetime, dislocation density, etc.
    • In addition, we can also detect the impurity content, impurity defect energy level, etc. to understand the purity of the material and the degree of compensation. Through X-ray and metallographic analysis to understand the stacking fault, dislocation density, inclusion and particle size of the crystal structure of semiconductor materials.
    • In industrial production, the general testing parameters are: crystal orientation, dislocation density, conductivity type, resistivity, minority carrier life test, etc.

    Note: this service is for Research Use Only and Not intended for clinical use.