Atomic Force Microscopy (AFM) Lab Services

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Atomic Force Microscopy (AFM) is a powerful technique that can be used to study the surface structure of solid materials including insulators. It is mainly used to measure the surface morphology, surface potential, friction, viscoelasticity, I/V curve and other surface properties of substances. It can image almost all types of surfaces, including polymers, ceramics, composites, glass, and biological samples.

As a professional reliability third-party testing organization, T,C&A Lab's Atomic Force Microscopy (AFM) Laboratory can provide the following services according to ISO, ASTM and other standards. Welcome to contact our experts for consultation.

Comparison of AFM with other surface characterization tools

Parameter	SEM	TEM	AFM
Measurement environment	Vacuum	Vacuum	Air, water, gas, vacuum, etc.
Surface height	Not possible	Not possible	Possible
Measurement dimension	2D	2D	3D
Size of equipment	Large	Large	Very small
Cost	Expensive	Expensive	Cheap
Usage	Skilled operator required	Skilled operator required	Easy to use
Measurement speed	Fast	Fast	Slow

Scope of application

AFM is widely used in various fields of surface analysis, through the analysis, induction, and summary of surface topography to obtain deeper information. It can be used to study the surface morphology, surface reconstruction, friction force of metals, semiconductors and non-metal materials, and obtain spatial three-dimensional images of information such as phase boundaries, fractal structures and lateral forces.

Testing capabilities include but are not limited to

Surface properties measurement
Hardness and modulus measurement
AFM measurements for characterizations of surface treatment effects
Surface observation
Size determination
Surface roughness measurement
Granularity analysis
Statistical processing of bumps and pits
Evaluation of film forming conditions
Measurement of the size step of the protective layer
Evaluation of flatness of interlayer insulation film
VCD coating evaluation
Evaluation of the rubbing treatment process of oriented film
Defect analysis

Standards we test to

ASTM E2382, ASTM E2859
ISO/DTR 13096, ISO 13095, ISO 21222, ISO 28600, ISO/DIS 23729, ISO 13095, ISO 19606, ISO/TR 11811, ISO 11775

In addition, the experts in our Atomic Force Microscopy (AFM) Laboratory also provide a variety of custom services as your needs and requirements. Let's discuss the custom services with our experts for free.

Instruments and data

Atomic Force Microscopy (AFM) Lab Services

References

Khan, M. K.; et al. Atomic force microscopy (AFM) for materials characterization. Materials Characterization Using Nondestructive Evaluation (NDE) Methods. Woodhead Publishing, 2016. 1-16.
Liu, Yizhi, et al. Poss dental nanocomposite resin: Synthesis, shrinkage, double bond conversion, hardness, and resistance properties. Polymers 10.4 (2018): 369.

Note: this service is for Research Use Only and Not intended for clinical use.

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T,C & A LAB is an independent lab providing quality or custom testing, characterization and analysis of a variety of materials. Our engaged experts are ready to help you.

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