SEM/EDS Testing Services
Scanning Electron Microscope (SEM): The electron beam emitted by the cathode is accelerated by the anode and then accelerated by the magnetic lens to form an electron beam with a diameter of tens to thousands of Angstroms. When the high-energy electron beam bombards the sample surface, a variety of information will be excited. After being collected separately and magnified, the corresponding images can be obtained from the display screen.
Energy Dispersive Spectrometer (EDS): The incident electron beam can stay at any position on the observed area. X-rays are generated in a volume of 1 micron in diameter. The distribution of elements on the sample surface can be analyzed in quality and quantity. The high-energy electron beam bombards the sample surface and excites various signal.
The combination of SEM and EDS is very powerful, which can not only observe the morphology of the micro area, but also analyze the composition of the micro area. It is widely used in all kinds of analysis work. SEM/EDS can be used to obtain the morphology, particle size distribution, semi quantitative elements and so on, which can be used as a basic reference for subsequent analysis. It belongs to non-destructive testing and does not consume samples.
As a professional reliability third-party testing organization, T,C&A Lab's SEM/EDS Lab can provide the following services according to ISO, ASTM and other standards. Welcome to contact our experts for consultation.
Our SEM/EDS laboratory can provide the following services:
- It can perform morphology observation and composition analysis on ceramics, metals, powders, plastics and other samples.
- Observation of the micro-area morphology on the surface of solid samples.
- Thin coating thickness measurement (good pre-treatment, can measure 0.1µm or even lower film thickness).
- Analysis of material fracture topography and internal structure.
- Shape observation and size analysis of particles or fibers.
- Qualitative and semi-quantitative analysis of micro-area composition on the surface of solid samples.
- Surface phase analysis, inclusion identification, etc.
- Analysis of welding or synthetic interface.
- Tin whisker observation.
Requirements for SEM/EDS testing of solid samples:
- The sample must be dry and moisture-free
- The sample has good thermal stability and is not easy to volatilize
- The sample must have good conductivity
- The sample must be non-magnetic or weakly magnetic
- Sample size and thickness
Moisture volatilization will cause a sharp decrease in vacuum in the warehouse, resulting in image drift, white stripes, and even affect the life of the filament. Samples containing moisture should be dried first.
Samples with poor thermal stability tend to decompose under the bombardment of electron beams, releasing gases and other substances and contaminating the electron microscope. Samples containing volatile substances need to be dried first.
Samples with poor conductivity will have a charging effect, causing image distortion, bright lines, and astigmatism. For non-conductive materials, a conductive film needs to be coated on the surface.
The electron beam of the scanning electron microscope will be affected by the sample magnetic field, and severe astigmatism will occur during observation. In addition, the magnetic powder may be adsorbed on the probe and damage the electron microscope. For strong magnetic samples, pre-demagnetization treatment is required.
Depending on the installation of our sample table, please consult our experts for details.
Standards we test to
- ASTM E1588, ASTM E2809
- ISO 22309, ISO 20720, ISO 15632, ISO 22493, ISO 15632
In addition, the experts in our SEM/EDS Laboratory also provide a variety of custom services as your needs and requirements. Let's discuss the custom services with our experts for free.
Instruments and data
- Dong, X. L.; et al. Recycling Phosphated Residue for Pb2+ Removal from Wastewater. Environmental Engineering Science. 33.3 (2016): 207-214.
- Wickham; et al. Processability of lead-free component termination materials. (2001).
Note: this service is for Research Use Only and Not intended for clinical use.
- Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES)
- X-Ray Fluorescence (XRF) Testing
- X-Ray Photoelectron Spectroscopy (XPS) Testing
- Infrared Spectroscopy Testing
- Ultraviolet Spectrum (UV) Testing
- Mass Spectrometry Testing
- Micro-Raman Spectroscopy Testing
- Nuclear Magnetic Resonance Spectroscopy Testing
- Elemental Analysis
- Structural Characterization
- Morphology & Size Analysis
- Corrosion Inhibitor Testing
- Crevice Corrosion Testing
- Electrochemical Corrosion Testing
- Galvanic Corrosion Testing
- High Pressure High Temperature (HPHT) Corrosion Testing
- Hydrogen Embrittlement Testing
- Intergranular Corrosion (IGC) Testing
- Pitting Corrosion Testing
- Salt Spray Testing
- Sour Service Corrosion Testing
- Stress Corrosion Cracking (SCC) Testing
- Sulfide Stress Cracking (SSC) Testing
- Thermal Analysis
- Mechanical Testing
- Non-Destructive Testing
- Performance Testing
- Pharmaceutical Testing
- Chemical Analysis
- Case Depth Testing and Analysis
- Grain Size Analysis
- Particle Size Distribution Analysis and Testing
- Coating Thickness Testing
- Inclusion Rating
- Ferrite Testing
- Porosity Testing
- Grain Flow Testing and Analysis
- Weld Testing
- X-Ray Diffraction (XRD) Analysis
- Scanning Electron Microscopy (SEM) Laboratory
- Harmful Substances Testing
- Reverse Engineering & Deformulation
- Industrial Problem Diagnosis
- Ingredient Analysis