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Transmission Electron Microscopy (TEM) Lab Services

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  • Transmission Electron Microscopy (TEM) Lab Services

    Transmission electron microscope (TEM) is to project the accelerated and concentrated electron beam onto a very thin sample. The electron collides with the atoms in the sample and changes the direction, resulting in solid angle scattering. The scattering angle is related to the density and thickness of the sample, so different light and dark images can be formed. Generally, the resolution of transmission electron microscope is 0.1-0.2nm, and the magnification is tens of thousands to millions of times. It is used to observe the ultrastructure, that is, the structure which is less than 0.2μm and cannot be seen clearly under the optical microscope.

    TEM is a very useful tool in the fields of materials, physics, chemistry, and life sciences. We often need to use a TEM to obtain the surface (or topography) and internal information of the sample.

    As an important means of material characterization, TEM can not only use diffraction mode to study the structure of crystals, but also obtain high-resolution images in real space in imaging mode, that is, directly image the atoms in the material and directly observe the microstructure of the material.

    As a professional reliability third-party testing organization, T,C&A Lab's Transmission Electron Microscopy (TEM) Laboratory can provide the following services according to ISO, ASTM and other standards. Welcome to contact our experts for consultation.

    Our testing scope includes:

    • Metal
    • Mineral
    • Semiconductor
    • Superconductor
    • Solid nanomaterials such as inorganic compounds

    Testing content includes:

    • Sample morphology
    • Crystal structure and element composition
    • Mass thick contrast image
    • Brightfield diffraction contrast image
    • Darkfield diffraction contrast image
    • Lattice fringe image
    • Electron diffraction image
    • Energy spectrum

    Main application fields:

    • Physics
    • Chemistry
    • Biology
    • Material science
    • Mineralogy
    • Geology
    • Mineral processing
    • Metallurgical engineering and other fields

    Sample requirements

    • Basic requirements for powder samples
      • The size of a single powder is preferably less than 1μm;
      • Non-magnetic;
      • Mainly inorganic components, otherwise it will cause serious pollution of the electron microscope, high voltage jump, or even damage the high voltage gun.
    • Basic requirements for bulk samples
      • Electrolytic thinning or ion thinning is required to obtain a thin area of tens of nanometers to observe;
      • If the grain size is less than 1μm, it can also be observed by making powder by mechanical methods such as crushing;
      • Non-magnetic;
      • The preparation of bulk samples is complicated, time-consuming, and many procedures, the preparation of the samples directly affects the observation and analysis of the electron microscope. Therefore, before preparing bulk samples, it is best to communicate with our TEM experts, or hand them over to our experts for preparation.

    Standards we test to

    • ASTM D7201, ASTM D6281, ASTM D5755, ASTM D6480, ASTM E3143
    • ISO 29301, ISO 10312, ISO 13794, ISO 13794, ISO 10312, ISO 21363, ISO/TS 10797, ISO/PRF TS 22292, ISO 19214

    In addition, the experts in our Transmission Electron Microscopy (TEM) Laboratory also provide a variety of custom services as your needs and requirements. Let's discuss the custom services with our experts for free.

    Instruments and data

    TEM Testing
    TEM Testing Service
    TEM

    Reference

    1. Yang, J.; et al. S‐Doped TiSe2 Nanoplates/Fe3O4 Nanoparticles Heterostructure. Small. 13.42 (2017): 1702181.

    Note: this service is for Research Use Only and Not intended for clinical use.

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    T,C& A LAB is an independent lab providing quality or custom testing, characterization and analysis of a variety of materials. Our engaged experts are ready to help you.

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