Atomic Force Microscope
AFM, whose full name is Atomic Force Microscope, is a new type of instrument with high atomic resolution. The physical properties, including morphology, of all kinds of materials and samples can be detected in the atmosphere and liquid environment. AFM has been widely used in the fields of semiconductor, nano-functional materials, biology, chemical industry, food, medical research, and various nano-related disciplines in scientific research institutes, and has become the basic tool of nano-science research.
Applications & industries
AFM can work in various environments such as atmosphere, vacuum, low temperature and high temperature, different atmospheres and solutions, and is not limited by the conductive properties of the sample, so it has been more widely used than STM.
- High-resolution imaging of conductor, semiconductor and insulator surfaces
- High resolution imaging of biological samples and organic membranes
- Surface chemical reaction research
- Life sciences, medicine, electricity
- Materials, chemical sciences
- Failure analysis
- Nanofabrication and manipulation
- Ultra-high density information storage
- Intermolecular force and surface force research
- Tribology and various mechanics research
- Online inspection and quality control
- Diversified working environment (under the atmosphere, in liquid)
- Better resolution for insulator imaging than STM
- Suitable for various materials including insulators
- Real-time, true three-dimensional sample surface image
- Limited by sample factors
- The needle tip is easy to blunt or be contaminated (wear cannot be repaired; contamination is difficult to clean)
- Small force between tip and sample
- Near-field measurement interference problem
- Low scan rate
- Amplification effect of the needle tip
- Observation of small size samples
- Surface analysis of fiber modification
It is suitable for observing atomic samples, DNA molecules, etc., and has extensive research in nanomaterials, molecular biology, bionics and other research fields.
AFM can be used to transport and etch atoms on the surface of the sample, so as to fabricate nano-devices.
The adhesion and attraction of the unmodified fiber and the grafted fiber were measured by AFM, and it was found that the orientation region of the unmodified fiber and the grafted fiber was almost the same, which was much weaker than that of the grafted fiber. The attraction and adhesion of the latter increased by 15 times and 4 times, respectively, indicating that the particles were grafted polymers and the linear orientation region was composed of crystalline microfibers.
AFM technical specifications
- Horizontal resolution: < 1 nm (actual resolution)
- Technical resolution: 0.19 nm (18 bits)
- Mathematical resolution: 32 bits (< 0.1 pm).
- Vertical resolution: < 150 pm DNC bottom noise (atomic step and atomic layer)
- Technical resolution: 0.19 nm (18 bits)
- Scan range: 50 μm (standard, other optional), Z axis range: 6 µm
- Sample size: 4 cm × 6 cm
- Manual positioning range: 5 mm × 5 mm
In conclusion, T,C&A Lab can offer AFM services that can solve materials testing related problem. Finally, please complete the form to have an expert discuss your AFM imaging needs.
Note: this service is for Research Use Only and Not intended for clinical use.
- Atomic Absorption Spectroscopy (AAS)
- Atomic Force Microscope
- Auger Electron Spectroscopy
- Electron Backscatter Diffraction
- Energy Dispersive Spectrometer (EDS)
- Focused Ion Beam (FIB)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Gas Chromatography - Mass Spectrometry (GC-MS)
- Gel Permeation Chromatography (GPC)
- Glow Discharge-Mass Spectrometry (GD-MS)
- IGA Gas Adsorption System
- Inductively Coupled Plasma-Mass Spectrometry (ICP-MS)
- Ion Chromatography (IC)
- Laser Ablation-Inductively Coupled Plasma Mass Spectrometer (LA-ICP-MS) System
- Nuclear Magnetic Resonance (NMR)
- Raman Spectrometer
- Rutherford Backscattering Spectrometry (RBS)
- Scanning Electron Microscope (SEM)
- Secondary Ion Mass Spectroscopy (SIMS)
- Thin-Layer Chromatography (TLC)
- Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
- Total Reflection X-ray Fluorescence
- X-Ray Diffraction (XRD)
- X-Ray Fluorescence (XRF)
- X-ray Reflectivity (XRR)