Laser Ablation-Inductively Coupled Plasma Mass Spectrometer (LA-ICP-MS) System
LA-ICP-MS, the full name of Laser Ablation-Inductively Coupled Plasma Mass Spectrometer, is an in-situ, micro-area, trace element analysis technology. At present, the application of LA-ICP-MS mainly focuses on the detection of geology, environment, biology, materials and industrial products. It can analyze major, trace and ultra trace elements, especially in rare earth elements, PGEs and isotope analysis. It has the advantages of in-situ, real-time and rapid analysis, high sensitivity, low detection limit, high spatial resolution, relatively simple spectral lines, simultaneous determination of multi-elements and the ability to provide isotope ratio information.
The ability of T,C&A Lab
The routine analysis that can be carried out by LA-ICP-MS system usually includes in-situ micro-quantitative analysis of major and trace elements in common silicates, sulfides, oxides and other minerals, as well as in-situ micro-U-Pb dating of some minerals (such as zircon, apatite, cassiterite, wolframite, garnet, etc.).
Our analysis and testing projects include:
- U-Th-Pb isotopic dating of accessory minerals such as zircon, monazite, apatite, rutile, garnet, yttrium phosphate, cassiterite, etc.
- Micro-area in-situ trace element analysis of minerals (silicate, phosphate, oxide, etc.).
- Micro-area in-situ trace element analysis of quartz.
In addition, on the basis of routine analysis, our laboratory has customized or upgraded key components such as laser ablation aperture, ablation cell, micro-infrared combination and carrier gas transmission system, which can realize the quantitative determination of major and trace elements in individual inclusions in different types of matrix minerals (such as silicate, sulfide, oxide, etc.).
Applications of LA-ICP-MS
- Overall analysis
- Single mineral microanalysis
For homogeneous samples such as rock powder, glass, ceramics and alloys, LA-ICP-MS can effectively overcome the losses caused by wet dissolution and the errors caused by incomplete dissolution (especially some parasitic insoluble accessory minerals). Due to the high energy coupling efficiency of the ultraviolet laser, the instantaneous ablation temperature is as high as 10,000 oC, the insoluble elements in the LA-ICP-MS sample can be effectively evaporated into the plasma, which can improve the accuracy of the analysis. The rock standard reference material is made into XRF frit glass, and a higher ablation frequency and a larger ablation aperture are used during the ablation process, and the overall analysis is performed in a scanning mode.
For the microanalysis of single mineral particles with a diameter of less than 100 μm, LA-ICP-MS can accurately analyze the element content and isotope ratio in order to study the distribution of element content in mineral particles, trace elements and isotope distribution of minerals with zonal structure, and the distribution coefficient between fluid crystallization phase and melting phase, thus the physical and chemical conditions of diagenesis, genetic mechanism and the evolution of geological structures can be inferred. The micro-area analysis of single mineral particles requires that the laser denudation system has higher spatial resolution and lower detection limit.
In the LA-ICP-MS laser ablation process, it is necessary to consider the influence of ablation energy combination, ablation aperture, ablation frequency and other factors to prevent cracks, bursts, or ablation of other minerals in particulate minerals, resulting in inaccuracy of analysis results. The mineral is made into a thicker probe sheet, a lower laser energy, a smaller ablation aperture, and a single-point ablation method are used to conduct micro-area analysis of single mineral.
In conclusion, T,C&A Lab can offer LA-ICP-MS services that can solve materials testing related problem. Finally, please complete the form to have an expert discuss your needs.
Note: this service is for Research Use Only and Not intended for clinical use.
- Atomic Absorption Spectroscopy (AAS)
- Atomic Force Microscope
- Auger Electron Spectroscopy
- Electron Backscatter Diffraction
- Energy Dispersive Spectrometer (EDS)
- Focused Ion Beam (FIB)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Gas Chromatography - Mass Spectrometry (GC-MS)
- Gel Permeation Chromatography (GPC)
- Glow Discharge-Mass Spectrometry (GD-MS)
- IGA Gas Adsorption System
- Inductively Coupled Plasma-Mass Spectrometry (ICP-MS)
- Ion Chromatography (IC)
- Laser Ablation-Inductively Coupled Plasma Mass Spectrometer (LA-ICP-MS) System
- Nuclear Magnetic Resonance (NMR)
- Raman Spectrometer
- Rutherford Backscattering Spectrometry (RBS)
- Scanning Electron Microscope (SEM)
- Secondary Ion Mass Spectroscopy (SIMS)
- Thin-Layer Chromatography (TLC)
- Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
- Total Reflection X-ray Fluorescence
- X-Ray Diffraction (XRD)
- X-Ray Fluorescence (XRF)
- X-ray Reflectivity (XRR)