X-Ray Fluorescence (XRF)
X-ray fluorescence spectrometer (XRF) is an element analysis tool and one of the main analytical instruments in testing laboratory. This diversified nondestructive testing method requires very little sample preparation, and the testing technology can quickly provide accurate testing results. This testing technology has made key applications in more and more fields, especially in quality control.
The principle of XRF
X-ray fluorescence spectroscopy is based on the principle that when an external energy source is excited, a single atom emits X-ray photons of a specific wavelength, and different elements in the sample can be identified by counting the photons of each energy emitted by the sample.
- Testing elements: 75 elements ranging from sulfur to uranium
- Analysis range of element content: 1 ppm-99.99%
- The detection limit of harmful elements (limited to Cd/Pb/Cr/Hg/Br) specified in the RoHS directive is as high as 1 ppm
- Measuring time: 60~300 s
- Energy resolution: 165 ± 5 eV
- Pipe pressure: 5~50 kV
- Pipe flow: 50~1000 μA
- High analysis speed. The determination time is related to the precision, but it is generally very short. All the elements in the sample can be determined in 2-5 minutes.
- The X-ray fluorescence spectrum has nothing to do with the chemical binding state of the sample, and has nothing to do with the state of solid, powder, liquid, crystalline, amorphous and other substances.
- Non-destructive analysis. In the determination, the chemical state will not be changed, and the sample dispersion phenomenon will not occur. The same sample can be measured many times, and the result has good reproducibility.
- X-ray fluorescence analysis is a physical analysis method that can also analyze elements belonging to the same group in chemical properties.
- High analytical precision.
- Simple sample preparation, solid, powder, and liquid samples can be analyzed.
- Standard samples are required for quantitative analysis.
- The sensitivity to light elements is lower.
- It is easily affected by mutual element interference and superimposed peaks.
Main application industries
- Petrochemical industry
- Detect the pollution and harmful elements of crude oil, fuel oil, lubricating oil, residue and other oil products.
- Detect the active components of the catalyst: Pt, Pd, Ir, Re and other precious metal elements or Ni, Co, W, Mo and other non-precious metal elements. Through the analysis of the elements in the catalyst, the catalytic activity can be judged.
- Detect the residues and impurities in the polymer: Na, Mg, Al, Si, P, S, Ca, Ti, Fe, Zn, etc., harmful elements: As, Br, Cd, Pb, etc.
- Environmental protection solid waste industry
- Environmental monitoring: soil, atmospheric particles.
- Environmental protection: solid waste.
- Solid waste treatment: by-product flue gas, slag, and fly ash from garbage incineration.
- Glass, ceramics and other industries
- Detect the main raw materials and auxiliary raw materials in glass materials. The main raw materials refer to the raw materials that introduce the oxides of glass components. The main components are SiO2, Na2O, CaO, Al2O3 and MgO, which determine the physical and chemical properties of glass. Auxiliary raw materials refer to the raw materials that make the glass obtain some necessary properties and accelerate the melting process, such as clarifier, flux, colorant, decolorant, opacifying agent and so on.
- Detect the content of impurity elements in ceramic materials.
- ROHS and precious metal jewelry industry
- ROHS detection in electronic and electrical products: Cr, Pb, Cd, Br, Hg.
- Precious metal jewelry.
- Measuring the thickness of coating and film.
In conclusion, T,C&A Lab can offer XRF services that can solve materials testing related problem. Finally, please complete the form to have an expert discuss your needs.
- Kodom, K. Heavy metal pollution in soils from anthropogenic activities. Lap Lambert Academic Publishing 120 (2011).
Note: this service is for Research Use Only and Not intended for clinical use.
- Atomic Absorption Spectroscopy (AAS)
- Atomic Force Microscope
- Auger Electron Spectroscopy
- Electron Backscatter Diffraction
- Energy Dispersive Spectrometer (EDS)
- Focused Ion Beam (FIB)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Gas Chromatography - Mass Spectrometry (GC-MS)
- Gel Permeation Chromatography (GPC)
- Glow Discharge-Mass Spectrometry (GD-MS)
- IGA Gas Adsorption System
- Inductively Coupled Plasma-Mass Spectrometry (ICP-MS)
- Ion Chromatography (IC)
- Laser Ablation-Inductively Coupled Plasma Mass Spectrometer (LA-ICP-MS) System
- Nuclear Magnetic Resonance (NMR)
- Raman Spectrometer
- Rutherford Backscattering Spectrometry (RBS)
- Scanning Electron Microscope (SEM)
- Secondary Ion Mass Spectroscopy (SIMS)
- Thin-Layer Chromatography (TLC)
- Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
- Total Reflection X-ray Fluorescence
- X-Ray Diffraction (XRD)
- X-Ray Fluorescence (XRF)
- X-ray Reflectivity (XRR)